Keyword: Atomic Force Microscopy

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Research Article
Ultraviolet Light Exposure Effect on the Nanoscale Current-Voltage Characteristics of Bare and Silicate Nanoparticle Incorporated 3-aminopropyltrimethylsiloxane Films Deposited Using a Focus Ion Beam-Milled Atomic Force Microscopy Tip
Su-Yu Liao, Jheng-Jia Jhuang, Jing-Jenn Lin, Congo Tak-Shing Ching, You-Lin Wu
Applied Functional Materials, 1(1), December 2021, 31-39, https://doi.org/10.35745/afm2021v01.01.0005
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